Atomic force microscopy (AFM) is a method of topographical measurement, wherein a fine probe is raster scanned over a material, and the minute variation in probe height is interpreted by laser ...

Today we're looking at Atomic Force Microscopy! I built a "macro-AFM" to demonstrate the principles of an atomic force microscope, then we look at a real AFM (an nGauge AFM from ICSPI) and do a few ...

In this interview, Professor Emeritus Mervyn Miles at the University of Bristol speaks about the history and technology behind Atomic Force Microscopy (AFM) and Scanning Probe Microscopy (SPM). Can ...

AFM differs significantly from traditional microscopy techniques as it does not project light or electrons on the sample's surface to create its image. Instead, AFM utilizes a sharp probe while ...

The developed high-speed three-dimensional scanning force microscopy enabled the measurement of 3D force distribution at solid-liquid interfaces at 1.6 s/3D image. With this technique, 3D hydration ...

Researchers have used tip-scan high-speed atomic force microscopy combined with an optical microscope to observe light-induced deformation of azo-polymer films. The process could be followed in real ...

Atoms measure roughly 0.1 nanometers across, a scale so small that scientists spent more than six decades developing ...

Invented 30 years ago, the atomic force microscope has been a major driver of nanotechnology, ranging from atomic-scale imaging to its latest applications in manipulating individual molecules, ...

Researchers at Los Alamos National Laboratory in New Mexico, US have used visible light to both image and manipulate the ...

Researchers from Osaka University combine high-speed atomic force microscopy with a laser light source for real-time observation of azo-polymer films Osaka, Japan – Expanding our scientific ...