There is a rapidly growing interest in the use of structural techniques for testing random logic. In particular, much has been published on new techniques for on-chip compression of automatic test ...
The semiconductor industry has long relied on scan ATPG (automatic test pattern generation) tools instead of functional test to create stimulus-response patterns with very high fault coverage. But ...
Moore’s law has been the standard reference for semiconductor scaling. It roughly says that semiconductor design sizes, fueled by technology improvements, double every two years. Consequentially, the ...
New semiconductor technologies like FinFETs are giving rise to new types of fault effects not covered by standard stuck-at and at-speed tests. Automatic test pattern generation (ATPG) tools perform ...
Recent and continuing trends in the semiconductor industry pose challenges to IC test-data volumes, test application times, and test costs. The industry has thus far succeeded in containing test costs ...
Two test strategies are used to test virtually all IC logic—automatic test pattern generation (ATPG) with test pattern compression, and logic built-in self-test (BIST). For many years, there was a ...
WILSONVILLE, Ore. and SAN JOSE, Calif. -- August 19, 2009 – Mentor Graphics Corporation (NASDAQ: MENT) and LogicVision, Inc. (NASDAQ: LGVN) today announced that LogicVision stockholders have voted ...
One of the hottest markets for IC today is artificial intelligence (AI). The designs for AI chips are also among the largest and most complex, with billions of transistors, thousands of memory ...
BANGALORE, INDIA: Magma Design Automation Inc., a provider of chip design software, and LogicVision Inc., a provider of semiconductor built-in-self-test (BIST) and diagnostic solutions, announced that ...
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