EDN

Automatic test pattern generation with on-chip compression improves test quality

San Jose, Calif. — Magma Design Automation Inc. has launched the Talus automatic test pattern generation (ATPG) and Talus ATPG-X products with on-chip compression. These advanced ATPG products are ...
EDN

Decreasing the Cost of Test with Automatic Test Pattern Generation

Success in the electronics business hinges on producing high-quality products and using the most cost-effective methods to do so. As the number of devices on integrated circuits continues to double ...
Electronic Design

Design for Test: ATPG keeps pace with design complexity

Automatic test-pattern generation (ATPG) has played a key role in semiconductor logic test, but several trends driving the need for semiconductor test quality are challenging traditional ATPG tools.
Semiconductor Engineering

Can Your ATPG Do This? Cut Defects Escaping Detection With ML

Chipmakers worldwide consider Automatic Test Pattern Generation (ATPG) their go-to method for achieving high test coverage in production. ATPG generates test patterns designed to detect faults in the ...
Electronic Design

ATPG Tool Meets Growing Demand For Scan Test Compression

As IC design sizes continue to double every 18 to 24 months, those charged with testing the finished product are challenged on multiple fronts. Test-data volume and testing time are expanding, while ...
Semiconductor Engineering

AI-Driven Test Optimization Solves Semiconductor Test Costs And Design Schedules

Artificial Intelligence has become a pervasive technology that is being applied to solve today’s complex problems, especially in the areas involving exponentially large amounts of data, their analysis ...