Balancing yield and test is essential to semiconductor manufacturing, but it’s becoming harder to determine how much weight to give one versus the other as chips become more specialized for different ...

Chipmakers are ramping new tools and methodologies to achieve sufficient yield faster, despite smaller device dimensions, a growing number of systematic defects, immense data volumes, and massive ...

A patent-pending indentation method gathers data on a range of materials for which it was previously unobtainable Using Nanovea’s Mechanical Tester in indentation mode, with a cylindrical flat tip, it ...