EDN

Best in Test Finalists 2010: DFT, boundary scan, and emulation

JTAG Functional Test(JFT) provides developers with a new method for preparing tests fornon-boundary-scan portions of their boards. JFT simplifies tests ofmixed-signal parts such as ADCs and DACs, ...
EDN

Boundary-scan test goes into MicroTCA spec

Richardson, Texas—By being the first boundary-scan IEEE-1149.1/JTAG company to join the PICMG (PCI Industrial Computer Manufacturers Group), ASSET InterTech, Inc. is helping to define a system-level ...
Electronic Design

Learn ABCs Of JTAG Boundary-Scan Testing With Software Bundle

Boundry-scan testing (IEEE1149.1/JTAG) is a novel procedure for some test engineers and technicians. But ScanWorks Interconnect Development Station version 3.4 from Asset Intertech should ease their ...
Electronic Design

Embedded Test Complements Boundary Scan

Companies specializing in circuit board and system design-for-test (DFT) tools are pursuing a variety of strategies to serve test and debug applications based on innovations they announced over the ...
Business Wire

ASSET’s New FPGA-Controlled Test (FCT) Inserts and Operates a Board-Tester-in-a-Chip

RICHARDSON, Texas--(BUSINESS WIRE)--With new tools for the ASSET® ScanWorks® platform for embedded instruments engineers can simply select instruments they need, set their parameters and insert them ...