A new technical paper titled “Novel Transformer Model Based Clustering Method for Standard Cell Design Automation” was published by researchers at Nvidia. “Standard cells are essential components of ...

ATPG targets faults at IC-gate boundaries, but 50% of defects are located within cells. Learn how cell-aware ATPG and user-defined fault models help to ferret out these hard-to-squash bugs.

The right tool for the job makes all the difference. Ever try hammering a nail in with a rock? How many nails did you ruin before you gave up? Or try to tighten a crucial bolt by hand? It takes ...