For a long time, semiconductor defect inspection focused on particles, and particle defects remain an important cause of yield loss. But as devices have become more complex, additional kinds of ...

Rising at an 11.30% CAGR, the market is fueled by gate-all-around architectures, EUV process challenges, and the shift from sampling to exhaustive inline inspection NEWARK, DE / ACCESS Newswire / ...

MILPITAS, Calif.--(BUSINESS WIRE)--Today KLA-Tencor Corporation (NASDAQ:KLAC), the world’s leading supplier of process control and yield management solutions for the semiconductor and related ...

SAN FRANCISCO — A few weeks ago when Applied Materials announced that they were getting into the brightfield defect inspection biz, many saw it as a direct challenge to rival KLA-Tencor Corp. Wafer ...

HAWTHORNE, N.Y., July 9, 2025 /PRNewswire/ -- Microtronic, maker of advanced macro defect inspection systems and software, has announced a convenient and highly precise way to monitor the weights of ...

Taiwan-based manufacturer of AI fabric inspection machines shows end-to-end fabric defect detection and data integration from inspection through spreading to cutting NEW TAIPEI CITY, April 30, 2026 ...

The NSX 220 macro-defect inspection system from Rudolph Technologies uses gray-scale image analysis with color image capture to provide automatic inspection and metrology in final manufacturing ...

The Atomic Force Microscope (AFM) has evolved from an extremely high resolution scientific research instrument into a highly accurate metrology tool. This evolution has broadened the role of the AFM ...

The chip industry is conservative when it comes to adopting new metrology and inspection. Will it ultimately see NVD inspection as a wunderkind, or an also-ran? Remember when it first became obvious ...

Perceptual Robotics raises funding from Loggerhead Ventures and One Planet Capital to scale autonomous wind turbine ...