Lattice Semiconductor announced the latest release of the Lattice sensAI solution stack, delivering expanded model support, ...

In 2024, the global market size of Wafer Defect Inspection System was estimated to be worth USD 7661 Million and is forecast ...

Relying solely on end-of-line testing isn't enough when security, traceability, and mission reliability are vital.

Detecting macro-defects early in the wafer processing flow is vital for yield and process improvement, and it is driving innovations in both inspection techniques and wafer test map analysis. At the ...

Scientists from China have developed a new deep-learning method for detecting defects in PV cells. Analyzing electroluminescence (EL) images, the novel system utilizes the YOLOv8 convolutional neural ...