The B4655A FPGA dynamic probe application works with the company’s logic analyzers to debug Xilinx FPGAs, including the Virtex-II, Virtex-II Pro, and Spartan-3 families. Interacting with on-chip ...

Flying probe testing (FPT) has long been a reliable method for validating PCB designs, particularly for prototypes and low volume production. Unlike traditional in circuit testing (ICT), which relies ...

New Analysis Environment for Multi-Gigabit Transceivers in Virtex-4 and Virtex-5 Platforms Delivers Ease-of-Use and Productivity Boost to System Designers The new tool will be used by design teams in ...

The foundation of parametric test within semiconductor manufacturing is its usefulness in determining that wafers have been fabricated properly. Foundries use parametric test results to help verify ...

Test facilities are beginning to implement real-time maintenance, rather than scheduled maintenance, to reduce manufacturing costs and boost product yield. Adaptive cleaning of probe needles and test ...

A selection of probes, from [Jim Williams’] Linear Technology app note 72. It’s not often that we are shown an entirely new class of test equipment here at Hackaday, so it was with some surprise that ...

Often underestimated, RF field probes are critical to the implementation of a proper radiated immunity test system. All too often, system specifiers gloss over this essential element after having ...