This free of charge workshop is aimed at both experienced ellipsometry users as well as people new to ellipsometry. The format of the workshop includes an introduction, fundamentals of ellipsometric ...

QD-UKI are celebrating 22 years of Spectroscopic Ellipsometry workshops with our partners, J A Woollam. This free of charge workshop is aimed at both experienced ellipsometry users as well as people ...

The Nature Index 2025 Research Leaders — previously known as Annual Tables — reveal the leading institutions and countries/territories in the natural and health sciences, according to their output in ...

Photo-reflectance spectroscopy enhances semiconductor quality control with sensitive, contactless measurements of band structure and electric fields in devices.

Recently, a research group led by Prof. Gao Xiaoming and Prof. Liu Kun from Hefei Institutes of Physical Science (HFIPS), Chinese Academy of Sciences (CAS), developed a concentration-independent ...

A new technical paper titled “Ultra-wide-field imaging Mueller matrix spectroscopic ellipsometry for semiconductor metrology” was published by researchers at Samsung. “We propose an ultra-wide-field ...

Semiconductor devices are becoming thinner and more complex, making thin deposited films even harder to measure and control. With 3nm node devices in production and 2nm nodes ramping toward ...

A transparent conductive oxide (TCO) is a material that is optically transparent and electrically conductive. It is frequently utilized as a top electrode in thin-film solar cells, flat-panel displays ...