Nothing accelerates a testability engineer's receding hairline as the addition of further clock domains to the latest SoC or IC design. Avoiding clock skew during test is becoming one of the biggest ...

Patterns created using advanced fault models provide higher test coverage, improved defect detection, and higher-yielding ...

As chips get ever bigger and more complex, the electronic design automation (EDA) industry must innovate constantly to keep up. Engineers expect every new generation of silicon to be modeled, ...

As companies strive to achieve higher quality and reliability for their products, and as package sizes and the number of available pins continue to shrink, there is also a persistent need to keep test ...