Defect detection on optical surfaces and semiconductor wafers underpins the manufacture of high‐performance photonic components and integrated circuits. Techniques ...

Defect inspection scientists from Huazhong University of Science and Technology, Harbin Institute of Technology and The Chinese University of Hong Kong make a thorough review of new perspectives and ...

Detecting macro-defects early in the wafer processing flow is vital for yield and process improvement, and it is driving innovations in both inspection techniques and wafer test map analysis. At the ...

Electric vehicles, fast-charging infrastructure, renewable energy systems, and industrial power conversion are redefining what power semiconductors need to deliver: higher voltages, higher power ...

Atomic defects can tune carbon quantum dots across UV to near-infrared light, guiding cleaner design of sensors, bioimaging ...