A new publication from Opto-Electronic Advances; DOI 10.29026/oea.2024.240060, discusses multi-prior intelligent microscopy assisted high-throughput, pixel super-resolution quantitative phase imaging.
(A) When a traditional Gaussian beam is used, diffraction causes the illumination beam to widen at the edges. (B) Joint optimization scheme. A network predicts the positions of beads in the focal ...
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