Complex interrelated phenomena lead to battery failure, which is dependent on battery design, environment, chemistry, and true operation conditions. Therefore, studies at the component level are ...
Over the past decade, demand for nano-electrical characterization has rapidly increased due to the continuous miniaturization of electronic devices. The semiconductor and microelectronics industries ...
Scanning microwave microscopy (SMM) is a scanning probe method that uses the S11 parameter to calculate the local tip-sample microwave impedance. This impedance is affected by the sample’s local ...
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