STAr Technologies, a leading supplier of semiconductor reliability test systems, announced the shipment of the all-in-one SMU-per-pin test system, the STAr Pluto-hiVIP, to benchmark the semiconductor ...

Time-dependent dielectric breakdown (TDDB) testing is an indispensable step in qualifying semiconductor gate-oxide integrity, and vendors are responding with the instrumentation and probing ...

Advanced, short-geometry CMOS processes are subject to aging that causes major reliability issues that degrade the performance of integrated circuits (ICs) over time. Degradation effects causing aging ...

STAr Technologies, a provider of semiconductor test solutions, releases a new Sagittarius-WLR integrated platform for advanced Wafer-Level Reliability (WLR) tests. Sagittarius-WLR is developed to ...

Successful automotive electronic design requires a focus on safety, performance and customer satisfaction. This makes IC reliability not just a “nice to have” feature, but a fundamental requirement.