About a dozen years ago, the world of test had reached an economic impasse: most digital designs had become sufficiently complex that standard scan testing techniques were no longer cost-effective.

PARIS – Silicon Image Inc. announced it has licensed Synopsys' DFTMAX compression, an integral part of the Galaxy Implementation Platform, to reduce manufacturing test cost and time. Silicon Image ...

Small geometries have projected IC technology into an era where test has become a crucial part in the chip design process and have introduced new challenges needing solutions that use already ...

The ability to control test cost while design sizes have grown exponentially is a success story that relies on the invention and continuous improvement of embedded test compression. One way test ...