Test compression sounds like magic. Read on to learn how this trick is done. Large, complex ICs are viable because their design meets test as well as functional requirements. Design for test (DFT) was ...
A typical pattern generator-style test methodology (test vectors) often is used when testing digital devices to verify functionality, register access, and determine that read/write data meets design ...
Some results have been hidden because they may be inaccessible to you
Show inaccessible results