Balancing yield and test is essential to semiconductor manufacturing, but it’s becoming harder to determine how much weight to give one versus the other as chips become more specialized for different ...

Many sources of yield loss, including out-of-spec equipment, incorrect handling of material, photomask defects, design-process sensitivities, library marginalities, and test issues, can occur during ...

Diagnosis-driven yield analysis identifies the cause of systematic yield loss to speed yield ramp on new processes and improves yield on mature processes. Finding the root cause of yield loss is ...