Dual-frequency resonance tracking (DFRT) is a technique that utilizes contact mode atomic force microscopy (AFM) to measure a sample’s weak electrical or mechanical responses. Conventional resonance ...
Something that probably unites many Hackaday readers is an idle pursuit of browsing AliExpress for new pieces of tech. Perhaps it’s something akin to social media doomscrolling without the induced ...
Piezoresponse force microscopy (PFM) is an effective method for examining ferroelectric materials due to its nanometer-level resolution and high sensitivity, inherited from atomic force microscopy ...
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