Abstract: Sandia National Laboratories (SNL) has developed a custom pulsed laser single event effects testing facility utilizing a tunable wavelength (680–1080 nm), 140 fs, 80 MHz, Ti:sapphire laser.
A technical paper titled “Test Generation for Subcircuits with High Functional Switching Activities” was published by Irith Pomeranz at Purdue University. “Chip aging results in defects that are ...
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