Abstract: Scanning acoustic microscopy (SAM) plays a critical role in nondestructive inspection of semiconductor and industrial materials; however, deep-layer SAM images often suffer from severe ...
Abstract: Transparent and specular objects are frequently encountered in daily life, factories, and laboratories. However, due to the unique optical properties, the depth information on these objects ...
Some results have been hidden because they may be inaccessible to you
Show inaccessible results